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MCEM Facilities

MCEM currently supports four transmission electron microscopes, three scanning electron microscopes and two three-dimensional atom probes, as well as a broad range of instrumentation for sample preparation and image analysis. Two new field-emission gun TEMs, one with probe and image Cs corrector, and a FEG-SEM with EBSD, are under installation.

Transmission Electron Microscopes

Double-corrected FEI Titan3 80-300 FEGTEM (under installation) 300kV, FEG-TEM/STEM, Super -Twin pole piece; CEOS Cs probe corrector; CEOS Cs image corrector; on-axis BF/DF detector; EDAX 30 mm2 retractable Si(Li) X-ray detector and analyser; Gatan Tridium 863 P image filter; Gatan UltraScan 1000 P (2kx2k) CCD camera; tomography and high stability tomography goniometer, Gatan 636 Double tilt cooling holder, HCHTR3000 Double tilt He holder, Fischione Instruments 2040 Dual-axis advanced tomography holder. 
JEOL JEM 2100F FEGTEM (2008) 200 kV; FEG; TEM/STEM high resolution pole piece; piezo stage; oil free pumping system; Gatan UltraScan 1000 (2kx2k) CCD camera; tomography; Gatan 776 Enfina 1000 parallel detection EELS spectrometer, Gatan 777 STEM Pack, Gatan 692 Retractable TV Camera, JEOL 50 mm2 Si(Li) EDX detector, Gatan 655 Turbo pumping station, JEOL tomography software, Fischione Instruments 2030 Ultra-narrow gap advanced tomography holder.
Philips CM20 TEM (1992) 200kV; LaB6; scanning unit; twin pole piece; Oxford Instruments Si(Li) X-ray detector with ultra-thin window (UTW) and Moran X-ray analysis software; Gatan 831 SC600 Orius™ CCD camera (2.7kx2.7k), Gatan 805 BF/DF STEM system.
JEOL JEM 2011 TEM (2000) 200kV; LaB6; high resolution objective lens pole piece; Oxford Instruments Si(Li) X-ray detector with UTW and Inca X-ray analysis system; Gatan 622 SC TV camera; Gatan 894 UltraScan 1000 CCD camera (2kx2k); Gatan camera; Gatan 901 Hot Stage to 1000°C; Gatan 900 liquid N2 stage; Gatan 655 pumping station.

Scanning Electron Microscopes

JEOL JSM 7001F FEGSEM (under installation) FEG; 5-axis stage; IR camera; retractable BE detector; turbo-molecular pump; Bruker 10 mm2 Si drift detector and analysis system; HKL electron backscattered diffraction (EBSD) system.
JEOL JSM-840A SEM (1986) W filament; Oxford Instruments Si(Li) X-ray detector with UTW and Moran X-ray analysis and imaging system.
JEOL JSM 6300F FEGSEM (1991)

Cold FEG; Noran HPGe X-ray detector with UTW and WinEDS X-ray analysis and imaging system.

Focussed Ion Beam Microscope (to be ordered 2008)

3D Atom Probe Field Ion Microscopes

Kinbrisk 3D APFIM (2000) Kinbrisk 3D Atom Probe Field Ion Microscope
Oxford NanoScience 3D APFIM (2003) Oxford NanoScience 3D Atom Probe Field Ion Microscope

Other Equipment

Other equipment includes:

  • Specimen preparation equipment, software and dark rooms
  • Reichert FCS Cryo-microtome
  • Reichert Ultracut E microtome
  • Olympus Optical microscope with CCD camera
  • Struers Tenupol 2, 3, 5 Twin Jet Electro-Polishers
  • Atom Probe Tip Polisher (in-house)
  • Cressington 208HR Sputter Coater
  • Dynavac Evaporative Coater
  • Dynavac SC150 Sputter Coater
  • Gatan 691 Precision Ion Polishing System (PIPS), two systems
  • Gatan 682 Precision Etching and Coating System (PECS) and Perpendicular Slope
    Cutting Tool
  • Gatan 950 Solarus Advanced Plasma System
  • Gatan 656 Dimple Grinder
  • Gatan 601 Ultrasonic Disc Cutter
  • Struers Accutom 50 Precision Saw
  • Gentle Mill
  • Darkroom Facilities
  • Image Plate Reader (Ditabis Micron), and
  • Computer room and various software packages.