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| MCEM currently supports two transmission electron microscopes, two scanning electron microscopes
and two 3-D atom probes, as well as a broad range of instrumentation for sample preparation and
image analysis. Two new field-emission gun TEMs, one with probe and image Cs corrector, and a new FEG-SEM
with EBSD have recently been installed and will be commissioned by mid- 2008.
Booking of electron microscopes
and other equipment is available only to licensed users.
Click here for information on how to become an MCEM user. | |